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Discovery of fully efficient fault indicators along a data-based diagnosis process

Igor Bezmaternykh, Louise Trav\'e-Massuy\`es, Elodie Chanthery

Preprint con versión publicada

En palabras de los autores

The integration of model-based and data-driven paradigms provides a powerful framework for fault diagnosis by combining the interpretability of analytical redundancy relations, i.e., input-output relations that are used as diagnosis indicators in model-based diagnosis, with the adaptability of learning techniques. DT4X is a recent diagnosis algorithm that uses symbolic regression to generate multivariate relations leveraging some properties of analytical redundancy relations and uses them as split functions in a decision tree. However, its symbolic regression procedure optimizes only the separation between two selected classes at each node, often fragmenting the remaining classes and degrading both interpretability and diagnosis performance. This paper introduces DT4X+, an enhanced version of DT4X that modifies the construction of training sets and the symbolic-regression loss so that expressions separate the target classes while preserving the coherence of non-target classes. The resulting relations become fully consistent with ARR properties and lead to more informative splits, improved robustness, and better performance on dynamic-system datasets. Experiments conducted on several benchmark systems demonstrate the benefits of this enhanced formulation.

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Apareció: jueves, 24 de septiembre. arXiv. Preprint con versión publicada.

Versión publicada: 23rd IFAC World Congress (IFAC World Congress 2026), Aug 2026, Busan, South Korea

Comentario de los autores: Submission accepted to IFAC WC 2026 (waiting for publication)