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Correlations of Spectroscopic and Dielectric Properties of Hafnia-Zirconia Nanoparticles

Yuriy O. Zagorodniy, Eugene A. Eliseev, Petr Jiricek, Jana Houdkova, Lesya Demchenko, Oksana V. Leshchenko, Victor N. Pavlikov, Ihor V. Pleskach, Anna O. Diachenko, Mikhail D. Volnyanskii, Oleksandr S. Pylypchuk, Myroslav V. Karpets, Mikhail P. Trubitsyn, and Anna N. Morozovska

Preprint

En palabras de los autores

In this work we analyze correlations of X-ray photoelectron and diffraction spectra, and dielectric properties of hafnia-zirconia nanoparticles (the chemical compositions Hf0.4Zr0.6O2 and Hf0.6Zr0.4O2, and the average size of 7.5 nm) prepared by the solid-state organo-nitrate synthesis and annealed in air. The phase state of the nanoparticles, determined by the X-ray diffraction spectroscopy, is the coexistence of the nonpolar monoclinic (42 - 76 mass %) and orthorhombic (56 - 24 mass %) phases. Concentration of the oxygen vacancies was estimated from the X-ray photoelectron spectroscopy. The increase in the intensity of the dielectric permittivity maximum observed near 350 - 450 K in a PVDF matrix with embedded Hf0.4Zr0.6O2 nanoparticles can be related with an increase in oxygen vacancy concentration. Theoretical calculations, based on Landau-Ginzburg-Devonshire theory, explain the increase of the dielectric permittivity in Hf0.4Zr0.6O2 nanoparticles compared to Hf0.6Zr0.4O2 nanoparticles.

Resultado principalEl resumen no menciona limitaciones.

Apareció: miércoles, 23 de septiembre. arXiv. Preprint, todavía sin revisión por pares.

Comentario de los autores: 13 pages, 3 figures, To be submitted to the Semiconductor Physics, Optoelectronics and Quantum Electronics